Medical Engineering & Physics
Volume 28, Issue 8 , Pages 780-794 , October 2006

Automatic correction of artifact from single-trial event-related potentials by blind source separation using second order statistics only

  • K.H. Ting

      Affiliations

    • Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, HKSAR, PR China
    • ,
  • P.C.W. Fung

      Affiliations

    • Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, HKSAR, PR China
    • Division of Medical Physics, Department of Medicine, The University of Hong Kong, Pokfulam Road, Hong Kong, HKSAR, PR China
    • Corresponding Author InformationCorresponding author. Tel.: +852 2855 3356; fax: +852 2559 8738.
    • ,
  • C.Q. Chang

      Affiliations

    • Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, HKSAR, PR China
    • ,
  • F.H.Y. Chan

      Affiliations

    • Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong, HKSAR, PR China

Received 6 September 2004 ,Revised 24 September 2005 ,Accepted 18 November 2005.

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PII: S1350-4533(05)00248-1

doi: 10.1016/j.medengphy.2005.11.006

Medical Engineering & Physics
Volume 28, Issue 8 , Pages 780-794 , October 2006

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